STXM Spectromicroscopy Particle Analysis Routines

An automated data analysis method for atmospheric particles using scanning transmission X-ray microscopy coupled with near edge X-ray fine structure spectroscopy (STXM/NEXAFS). This method is applied to complex internally mixed submicron particles containing organic and inorganic material. Several algorithms were developed to exploit NEXAFS spectral features in the energy range from 278-320 eV for quantitative mapping of the spatial distribution of elemental carbon, organic carbon, potassium, and non-carbonaceous elements in particles of mixed composition. This energy range encompasses the carbon K-edge and potassium L2 and L3 edges. STXM/NEXAFS maps of different chemical components were complemented with a subsequent analysis using elemental maps obtained by scanning electron microscopy coupled with energy dispersive X-ray analysis (SEM/EDX). We demonstrate application of the automated mapping algorithms for data analysis and the statistical classification of particles.