2D FDTD of Total Internal Reflection phenomenon

Youtube links:
http://www.youtube.com/watch?v=PwAQ8T0meGs&feature=related
http://www.youtube.com/watch?v=8hSxGB4xB7c&feature=related

Written for Course :-
Computational Electromagnetics, Fall 2011
Department of Electrical Engineering
Indian Institute of Technology Madras (IITM)
Chennai - 600036, India

Authors :-
Sathya Swaroop Ganta, B.Tech., M.Tech. Electrical Engg.
Kayatri, M.S. Engineering Design
Pankaj, M.S. Electrical Engg.
Sumantra Chaudhuri, M.S. Electrical Engg.
Projesh Basu, M.S. Electrical Engg.
Nikhil Kumar CS, M.S. Electrical Engg.

Instructor :-
Dr. Ananth Krishnan
Assistant Professor
Department of Electrical Engineering
Indian Institute of Technology Madras
http://www.ee.iitm.ac.in/~ananthk

Description :-

A source of electric field is defined at the top edge of the spatial domain,(in glass) on the left half, which is a hard sinusoidal source, in that it does not change its value due to interference from external fields i.e in other words, the source is a perfect electric conductor. The free space wavelength and the angle of the plane of propagation of the wave from the source with the x-axis can be specified to suit reflection (TIR) phenomenon (wrt critical angle). The color scaled plot of Ez field over the entire spatial domain is shown at every time step as the wave propagates and hits the interface of the two media where it reflects (TIR) into the same medium (viz. glass) as angle alpha would be higher than critical angle (~42 degrees) between the two interfaces.