DB-KIT

版本 1.0.1.1 (19.0 MB) 作者: Yuchen JIANG
DB-KIT provides useful tools for data-driven process monitoring, prognosis and fault diagnosis. http://homepage.hit.edu.cn/jiangyuchen
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更新时间 2022/11/23

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DB-KIT provides a range of basic and advanced solutions published by the authors to process monitoring and fault diagnosis problems. Based on the research work throughout the past decade, DB-KIT includes functions that realize various widely-used prognosis and diagnosis approaches using only process data.
With the easy-to-use functions and intuitive demos, the users will find it useful for further investigation, comparison studies, as well as educational purpose.
Cite As: Y. Jiang, S. Yin, Recent Advances in key-performance-indicator oriented prognosis and diagnosis with a MATLAB Toolbox: DB-KIT, IEEE Transactions on Industrial Informatics. 15(5): 2849-2858, 2019.
Website: http://homepage.hit.edu.cn/jiangyuchen

引用格式

Y. Jiang, S. Yin, Recent Advances in key-performance-indicator oriented prognosis and diagnosis with a MATLAB Toolbox: DB-KIT, IEEE Transactions on Industrial Informatics. 15(5): 2849-2858, 2019.

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DB-KIT/All_m_files

DB-KIT/Auxiliary_Functions

DB-KIT/Auxiliary_Functions/layout_re-arrange

DB-KIT/MVA-FDD_Toolbox/PCA

DB-KIT/MVA-FDD_Toolbox/PLS

DB-KIT/Numerical_test

DB-KIT/RollingMill_test

DB-KIT/TEP_test

版本 已发布 发行说明
1.0.1.1

Maintenance of DB-KIT
1.0.1.0

Maintenance of DB-KIT
1.0.0.0