DB-KIT provides useful tools for data-driven process monitoring, prognosis and fault diagnosis. http://homepage.hit.edu.cn/jiangyuchen
DB-KIT provides a range of basic and advanced solutions published by the authors to process monitoring and fault diagnosis problems. Based on the research work throughout the past decade, DB-KIT includes functions that realize various widely-used prognosis and diagnosis approaches using only process data.
With the easy-to-use functions and intuitive demos, the users will find it useful for further investigation, comparison studies, as well as educational purpose.
Cite As: Y. Jiang, S. Yin, Recent Advances in key-performance-indicator oriented prognosis and diagnosis with a MATLAB Toolbox: DB-KIT, IEEE Transactions on Industrial Informatics. 15(5): 2849-2858, 2019.
引用格式
Y. Jiang, S. Yin, Recent Advances in key-performance-indicator oriented prognosis and diagnosis with a MATLAB Toolbox: DB-KIT, IEEE Transactions on Industrial Informatics. 15(5): 2849-2858, 2019.
| 版本 | 已发布 | 发行说明 | Action |
|---|---|---|---|
| 1.0.1.1 | Maintenance of DB-KIT |
|
|
| 1.0.1.0 | Maintenance of DB-KIT |
|
|
| 1.0.0.0 |
